ISTFA 2016 – International Symposium For Testing & Failure Analysis

ISTFA is the premier show for the semiconductor failure analysis (FA) community with the largest FA equipment exposition in the industry! No other meeting place brings together so many quality attendees from this variety of specialty trades.
• Analytical Tools (Auger, SIMs, EDX, FTIR, XRF, RGA)

• Test, Stress, and Measurement Tools (Probe Stations and Microprobes, Semiconductor Parameter Analyzers, Oscilloscopes, Curve Tracers, ESD/Latchup Testers, TDR, Engineering Testers)

• Sample Preparation (Mechanical and Chemical Decapsulation, Lapidary Supplies, Sectioning Tools, Plasma Etchers, FIB, Faceting Machines)

• Fault Isolation (Photon Emission Tools, Software Diagnostic Tools, Laser-Based Tools, Waveform Acquisition Tools, Magnetic Current Imaging, FIB) Etchants/Chemicals | ESD Protective Materials Manufacturing Tools for Microanalysis | Sample Preparation | Commercial Services Consulting | Integrated Circuit Testing and Burn-In

About ASM International:

ASM International is the world’s largest association of metals-centric materials engineers and scientists. We are dedicated to informing, educating, and connecting the materials community to solve problems and stimulate innovation around the world.  For more information Visit us at:  Share Conference Experience

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